RADIOCHEMICAL TECHNIQUE FOR DETERMINING DEPTH DISTRIBUTIONS IN MO

被引：18

作者：

ARORA, MR

KELLY, R

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1972年 / 119卷 / 02期

关键词：

D O I：

10.1149/1.2404173

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：270 / &

共 24 条

[1] Anodising in a Gas and in Methyl Cyanide - an Analogy [J].

Aladjem, A. .

JOURNAL OF MATERIALS SCIENCE, 1968, 3 (03) :328-328

[2]

Andersen T., 1970, Radiation Effects, V2, P111, DOI 10.1080/00337576908235592

[3]

ARORA MR, 1971, THESIS MCMASTER U

[4] RANGE OF ENERGETIC XE125 IONS IN MONOCRYSTALLINE SILICON [J].

DAVIES, JA ;

BROWN, F ;

BALL, GC ;

DOMEIJ, B .

CANADIAN JOURNAL OF PHYSICS, 1964, 42 (06) :1070-&

[5] ANOMALOUS PENETRATION OF XENON IN TUNGSTEN CRYSTALS-A DIFFUSION EFFECT [J].

DAVIES, JA ;

JESPERSGARD, P .

CANADIAN JOURNAL OF PHYSICS, 1966, 44 (07) :1631-+

[6]

DAVIES JA, 1963, ARK FYS, V24, P377

[7] A RADIOCHEMICAL TECHNIQUE FOR STUDYING RANGE-ENERGY RELATIONSHIPS FOR HEAVY IONS OF KEV ENERGIES IN ALUMINUM [J].

DAVIES, JA ;

FRIESEN, J ;

MCINTYRE, JD .

CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 1960, 38 (09) :1526-1534

[8] RANGES OF HEAVY IONS IN AMORPHOUS OXIDES [J].

DOMEIJ, B ;

BROWN, F ;

DAVIES, JA ;

MCCARGO, M .

CANADIAN JOURNAL OF PHYSICS, 1964, 42 (08) :1624-&

[9] RANGE MEASUREMENTS IN ORIENTED TUNGSTEN SINGLE CRYSTALS (0.1-1.0 MEV) .2. A DETAILED STUDY OF CHANNELING OF K42 IONS [J].

ERIKSSON, L .

PHYSICAL REVIEW, 1967, 161 (02) :235-&

[10] RANGE MEASUREMENTS IN ORIENTED TUNGSTEN SINGLE CRYSTALS (0.1-1.0 MEV) .I. ELECTRONIC AND NUCLEAR STOPPING POWERS [J].

ERIKSSON, L ;

DAVIES, JA ;

JESPERSGAARD, P .

PHYSICAL REVIEW, 1967, 161 (02) :219-+

← 1 2 3 →