AN AUTOMATED RELAXATION CALORIMETER WITH EXTENDED TEMPERATURE-RANGE

被引:23
作者
GRIFFING, BF
SHIVASHANKAR, SA
机构
[1] PURDUE UNIV,DEPT PHYS,W LAFAYETTE,IN 47907
[2] PURDUE UNIV,DEPT CHEM,W LAFAYETTE,IN 47907
关键词
D O I
10.1063/1.1136374
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:1030 / 1036
页数:7
相关论文
共 12 条
[1]   HEAT-CAPACITY MEASUREMENTS ON SMALL SAMPLES AT LOW-TEMPERATURES [J].
BACHMANN, R ;
SCHWALL, RE ;
THOMAS, HU ;
ZUBECK, RB ;
KING, CN ;
KIRSCH, HC ;
DISALVO, FJ ;
GEBALLE, TH ;
LEE, KN ;
HOWARD, RE ;
GREENE, RL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (02) :205-&
[2]  
DAHL AI, 1963, ADV CRYOGEN ENG, V8, P544
[3]  
Dierckx P., 1975, J COMPUT APPL MATH, V1, P165, DOI DOI 10.1016/0771-050X(75)90034-0
[4]   ANOMALOUS BEHAVIOR OF SILICON DIODE THERMOMETERS [J].
GERBER, JA ;
SELLMYER, DJ .
CRYOGENICS, 1978, 18 (10) :619-620
[5]  
GRAY DE, 1963, AIP HDB
[6]  
GRIFFING BF, 1977, REV SCI INSTRUM, V48, P1255
[7]   HEAT-CAPACITY MEASUREMENTS BY MEANS OF THERMAL RELAXATION METHOD IN MEDIUM TEMPERATURE-RANGE [J].
HATTA, I .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1979, 50 (03) :292-295
[8]   SPECIFIC-HEATS OF THE VANADIUM MAGNELI PHASES VNO2N-1 BETWEEN 0.4 AND 50-K [J].
KHATTAK, GD ;
KEESOM, PH ;
FAILE, SP .
PHYSICAL REVIEW B, 1978, 18 (11) :6181-6190
[9]  
MORRISON R, 1967, GROUNDING SHIELDING
[10]   THERMOMETRIC PROPERTIES OF COMMERCIAL SWITCHING DIODES [J].
NOTO, K ;
MURATA, T ;
FUKASE, T ;
NAKA, M ;
ARIKAWA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (04) :665-666