MODEL OF SCHOTTKY BARRIER HOT-ELECTRON-MODE PHOTODETECTION

[1] PHOTOELECTRIC EMISSION AND CONTACT POTENTIALS OF SEMICONDUCTORS [J]. PHYSICAL REVIEW, 1948, 74 (10): : 1462 - 1474

[2] ARCHER RJ, 1969, DEVICE RESEARCH C RO

[3] COHEN J, F1962869C0148 CONTR

[4] COHEN J, F1962868C0090 CONTR

[5] The analysis of photoelectric sensitivity curves for clean metals at various temperatures [J]. PHYSICAL REVIEW, 1931, 38 (01): : 45 - 56

[6] Plane waves of light II Reflection and refraction [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1928, 16 (01): : 1 - 25

[7] Plane waves of light I. Electromagnetic behavior [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1927, 15 (03): : 137 - 161

[8] HEAVENS OS, 1955, OPTICAL PROPERTIES T, pCH4

[9] A 1 TO 2 MUM SILICON AVALANCHE PHOTODIODE [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (07): : 1160 - &

[10] SZE SM, 1963, SEL63032 STANF EL LA

[1] PHOTOELECTRIC EMISSION AND CONTACT POTENTIALS OF SEMICONDUCTORS [J]. PHYSICAL REVIEW, 1948, 74 (10): : 1462 - 1474

[2] ARCHER RJ, 1969, DEVICE RESEARCH C RO

[3] COHEN J, F1962869C0148 CONTR

[4] COHEN J, F1962868C0090 CONTR

[5] The analysis of photoelectric sensitivity curves for clean metals at various temperatures [J]. PHYSICAL REVIEW, 1931, 38 (01): : 45 - 56

[6] Plane waves of light II Reflection and refraction [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1928, 16 (01): : 1 - 25

[7] Plane waves of light I. Electromagnetic behavior [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA AND REVIEW OF SCIENTIFIC INSTRUMENTS, 1927, 15 (03): : 137 - 161

[8] HEAVENS OS, 1955, OPTICAL PROPERTIES T, pCH4

[9] A 1 TO 2 MUM SILICON AVALANCHE PHOTODIODE [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (07): : 1160 - &

[10] SZE SM, 1963, SEL63032 STANF EL LA