MODELING REPAIRABLE SYSTEMS WITH FAILURE RATES THAT DEPEND ON AGE AND MAINTENANCE

被引:98
作者
CHAN, JK [1 ]
SHAW, L [1 ]
机构
[1] POLYTECH INST NEW YORK,SCH ELECT ENGN & COMP SCI,BROOKLYN,NY 11201
关键词
STOCHASTIC CYCLE AVAILABILITY; FAILURE RATE WITH REDUCTION (FIXED; PROPORTIONAL); WEIBULL DISTRIBUTION; PERFORMANCE INDEX; ASYMPTOTIC PERFORMANCE INDEX;
D O I
10.1109/24.273583
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A general repairable-system model that includes age & preventive-maintenance (PM) dependent failure rates is proposed. This model introduces the concept of system availability as a random variable, leading to availability measures for individual realizations, rather than for the average over many trials. Thus this model generalizes the classical definition, and serves as a performance index for system design. A design scheme is then suggested to maximize the probability of achieving a specified stochastic-cycle availability with respect to the duration of the operating interval between PMs. Numerical computations of the results for Weibull-like distributions illustrate the design criteria. Asymptotic behavior of the performance with no PM has been studied. Extension to other distributions is straight-forward.
引用
收藏
页码:566 / 571
页数:6
相关论文
共 13 条
[1]   OPTIMUM PREVENTIVE MAINTENANCE POLICIES [J].
BARLOW, R ;
HUNTER, L .
OPERATIONS RESEARCH, 1960, 8 (01) :90-100
[2]  
BARLOW RE, 1965, MATH THEORY RELIABIL
[3]  
CHAN JK, 1982, THESIS POLYTECHNIC I
[4]  
GOLDSTEIN J, 1980, THESIS POLYTECHNIC I
[5]  
Jorgenson DW, 1967, OPTIMAL REPLACEMENT
[6]  
Lie C. H., 1977, AIIE Transactions, V9, P247, DOI 10.1080/05695557708975153
[7]  
MARTZ HF, 1971, IEEE T RELIABILITY R, V20, P22
[8]   NOTE ON AVAILABILITY FOR A FINITE INTERVAL [J].
NAKAGAWA, T ;
GOEL, AL .
IEEE TRANSACTIONS ON RELIABILITY, 1973, R 22 (05) :271-272
[9]   OPTIMAL PREVENTIVE MAINTENANCE POLICIES FOR REPAIRABLE SYSTEMS [J].
NGUYEN, DG ;
MURTHY, DNP .
OPERATIONS RESEARCH, 1981, 29 (06) :1181-1194
[10]   BIBLIOGRAPHY FOR RELIABILITY AND AVAILABILITY OF STOCHASTIC-SYSTEMS [J].
OSAKI, S ;
NAKAGAWA, T .
IEEE TRANSACTIONS ON RELIABILITY, 1976, 25 (04) :284-287