SOFT-X-RAY AND VACUUM ULTRAVIOLET SPECTROSCOPY OF ION-BEAM-HEATED THIN TARGETS

被引：3

作者：

BURNS, EJT ^{[1
]}

JOHNSON, DJ ^{[1
]}

FARNSWORTH, AV ^{[1
]}

KUSWA, GW ^{[1
]}

DOSCHEK, GA ^{[1
]}

FELDMAN, U ^{[1
]}

机构：

[1] USN,RES LAB,EO HULBURT CTR SPACE RES,WASHINGTON,DC 20375

来源：

APPLIED PHYSICS LETTERS | 1979年 / 35卷 / 02期

关键词：

D O I：

10.1063/1.91051

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

XUV spectroscopy utilizing a 1-m grazing incidence spectrograph and photoelectric diodes is used to determine the response of approximately one-proton-range-thick planar targets to an intense beam of hydrogen and carbon ions. Electron temperature, brightness temperature, and total radiated power are then compared with radiation-hydrodynamic calculations to determine the ion-beam energy deposition and incident current density. Incident current densities of 25-35 kA/cm2 with 80% proton current and 20% singly ionized carbon ion current are consistent with the spectroscopic measurements.

引用

页码：140 / 142

页数：3

共 6 条

[1] VACUUM ULTRA-VIOLET EMISSION SPECTRA FROM LASER-PRODUCED PLASMAS
BURGESS, DD
FAWCETT, BC
PEACOCK, NJ
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1967, 92 (577P): : 805 - &
[2] SOLAR XUV GRAZING INCIDENCE SPECTROGRAPH ON SKYLAB
GARRETT, DL
TOUSEY, R
[J]. APPLIED OPTICS, 1977, 16 (04): : 898 - 903
[3] GRIEM HR, 1964, PLASMA SPECTROSCOPY, P154
[4] JOHNSON D, UNPUBLISHED
[5] STUDY OF AN ELECTRON-BEAM DISCHARGE INTO A VACUUM DIODE WITH POLYETHYLENE ANODE
KERNS, JR
JOHNSON, DJ
[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (12) : 5225 - 5228
[6] Zimmerman G. B., 1975, Comments on Plasma Physics and Controlled Fusion, V2, P51

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