CHARACTERIZATION OF MICRON-SIZE FLYASH PARTICLES BY X-RAY PHOTOELECTRON-SPECTROSCOPY (ESCA)

被引：9

作者：

CAMPBELL, JA ^{[1
]}

SMITH, RD ^{[1
]}

DAVIS, LE ^{[1
]}

SMITH, KL ^{[1
]}

机构：

[1] PHYS ELECTR IND INC,EDEN PRAIRIE,MN 55343

来源：

SCIENCE OF THE TOTAL ENVIRONMENT | 1979年 / 12卷 / 01期

关键词：

D O I：

10.1016/0048-9697(79)90007-X

中图分类号：

X [环境科学、安全科学];

学科分类号：

08 ; 0830 ;

摘要：

X-ray photoelectron spectroscopy has been used to identify and determine the concentrations and oxidation states for a number of major and minor elements present on the surface of micron-size fly-ash particles. Relative concentrations as a function of depth were obtained for Si, Al, Ti, Fe, Ca, Na, C, O, and S using a sputter-etching procedure. The concentrations of Na, C, and S were found to decrease, and Si, Al, Fe, and Ca were found to increase to a depth of approximately 500 Å. Analysis of a larger size fraction gave depth profiles which were similar to those from micron-size particles. The results are discussed in terms of current models for the formation of fly ash. © 1979.

引用

页码：75 / 85

页数：11

共 25 条

[1] ANALYSIS OF ENVIRONMENTAL PARTICULATE MATTER BY MEANS OF PHOTOELECTRON-SPECTROSCOPY [J].