X-RAY PERFECTION AND RESIDUAL DEFECTS IN GADOLINIUM GALLIUM GARNET SUBSTRATES

被引：7

作者：

BELT, RF ^{[1
]}

MOSS, JP ^{[1
]}

LATORE, JR ^{[1
]}

机构：

[1] LITTON SYST INC,LAMBDA AIRTRON DIV,MORRIS PLAINS,NJ 07950

来源：

MATERIALS RESEARCH BULLETIN | 1973年 / 8卷 / 04期

关键词：

D O I：

10.1016/0025-5408(73)90038-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：357 / 367

页数：11

共 13 条

[1]

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[2]

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[4] SOME DEFECTS IN CRYSTALS GROWN FROM THE MELT .1. DEFECTS CAUSED BY THERMAL STRESSES [J].

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[5] CZOCHRALSKI GROWTH OF RARE-EARTH GALLIUM GARNETS [J].

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VALENTINO, AJ .

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[6]

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[7] X-RAY DOUBLE CRYSTAL ANALYSIS OF FACETS IN CZOCHRALSKI GROWN GADOLINIUM GALLIUM GARNET [J].

GLASS, HL .

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[8] REPLICATION OF SUBSTRATE GROWTH BAND AND CORE STRUCTURES BY EPITAXIAL CVD GARNET FILMS [J].

GLASS, HL ;

HAMILTON, TN .

MATERIALS RESEARCH BULLETIN, 1972, 7 (08) :761-&

[9] X-RAY DOUBLE CRYSTAL TOPOGRAPHY OF EPITAXIAL MAGNETIC BUBBLE DOMAIN GARNETS [J].

GLASS, HL .

MATERIALS RESEARCH BULLETIN, 1972, 7 (05) :385-&

[10] FRACTURE OF BRITTLE EPITAXIAL FILMS UNDER INFLUENCE OF MISFIT STRESS [J].

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KLOKHOLM, E .

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