OXIDATION MECHANISMS ON ALPHA-BRASSES (10 AND 30 AT-PERCENT-ZN) BY OPTICAL METHODS AND SIMS

被引:5
作者
BEUCHER, E [1 ]
LENGLET, M [1 ]
WEBER, S [1 ]
SCHERRER, S [1 ]
机构
[1] ECOLE MINES NANCY,PHYS SOLIDE LAB,F-54000 NANCY,FRANCE
关键词
D O I
10.1002/sia.740180907
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Optical methods-Fourier transform infrared spectroscopy, ultraviolet-visible-near-infrared spectroscopy (UV-Vis-NIR)-are used to control the oxidation products grown on the surface of cold-worked alpha-brasses (10 and 30 at.% zinc). The influence of sample preparation (mechanical polishing and chemical cleanings) on oxidation rates is also studied. The duplex oxide scale (copper oxides on the top of the layer and zinc oxide at the metal/oxide interface) obtained during brass oxidation and perfectly exhibited by SIMS depth profiles can be explained in terms of internal oxidation and of the semiconductor properties of ZnO and Cu2O.
引用
收藏
页码:673 / 678
页数:6
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