COMPARISON OF YIELD VERSUS DEPTH FOR PARTICLE INDUCED AND PHOTON INDUCED X-RAY-EMISSION ANALYSIS

被引:11
作者
AHLBERG, MS [1 ]
机构
[1] FLORIDA STATE UNIV,DEPT OCEANOG,TALLAHASSEE,FL 32306
来源
NUCLEAR INSTRUMENTS & METHODS | 1977年 / 146卷 / 02期
关键词
D O I
10.1016/0029-554X(77)90737-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:465 / 467
页数:3
相关论文
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