AN ALIGNMENT METHOD FOR THE MARK II SILICON STRIP VERTEX DETECTOR USING AN X-RAY-BEAM

被引：3

作者：

ADOLPHSEN, C

GRATTA, G

LABARGA, L

LITKE, A

SCHWARZ, A

TURALA, M

ZACCARDELLI, C

BREAKSTONE, A

PARKER, S

BARNETT, B

BOSWELL, C

DAUNCEY, P

DREWER, D

MATTHEWS, J

VEJCIK, S

JACOBSEN, R

LUTH, V

机构：

[1] UNIV HAWAII,HONOLULU,HI 96822

[2] JOHNS HOPKINS UNIV,BALTIMORE,MD 21218

[3] STANFORD UNIV,STANFORD LINEAR ACCELERATOR CTR,STANFORD,CA 94305

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1990年 / 288卷 / 01期

关键词：

D O I：

10.1016/0168-9002(90)90496-S

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Silicon strip vertex detector consisting of 36 independent detector modules is being constructed for use in the Mark II detector at a SLAC Linear Collider. This paper describes a method for determining the relative alignment of the modules to a precision better than the 5 μm intrinsic resolution of the detectors. The basic procedure involves moving the vertex detector by known amounts through a fixed, collimated X-ray beam, and using the beam position reconstructed from the detected signals to determine the relative positions and orientations of the modules. Results from tests of the method on a subset of detectors are presented. © 1990.

引用

页码：257 / 264

页数：8

共 7 条

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