COMPLEX PERMITTIVITY OF LANTHANUM ALUMINATE IN THE 20-K TO 300-K TEMPERATURE-RANGE FROM 26.5 TO 40.0 GHZ

被引：8

作者：

MIRANDA, FA

GORDON, WL

BHASIN, KB

EBIHARA, BT

HEINEN, VO

CHOREY, CM

机构：

[1] Case Western Reserve University, Cleveland, Ohio

[2] Lewis Research Center, Cleveland, Ohio

[3] Sverdrup Technology, Inc, NASA Lewis Research Center Group, Cleveland, Ohio

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 1990年 / 3卷 / 01期

关键词：

Complex permittivity; lanthanum aluminate substrates; microwave measurements; superconductors;

D O I：

10.1002/mop.4650030105

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Dielectric constants of microwave subtrales are required in the design of superconducting microwave circuits at various temperatures. In this paper, we report the results of a study of the complex permittivity of the newly developed lanthanum aluminate (LaAIO3) substrate, in the 20 to 300 K temperature range at frequencies from 26.5 to 40.0 GHz. The value of the complex permittivity was obtained by measuring the sample scattering parameters using a microwave waveguide technique. It is observed that, while the dielectric constant did not change appreciably with frequency, its value decreased by approximately 14 percent from room temperature to 20 K. Copyright © 1990 Wiley Periodicals, Inc., A Wiley Company

引用

页码：11 / 13

页数：3

共 8 条

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