EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (EXAFS) STUDY ON THE LOCAL ENVIRONMENT AROUND COPPER IN LOW THERMAL-EXPANSION COPPER ALUMINOSILICATE GLASSES

被引：24

作者：

KAMIYA, K ^{[1
]}

OKASAKA, K ^{[1
]}

WADA, M ^{[1
]}

NASU, H ^{[1
]}

YOKO, T ^{[1
]}

机构：

[1] KYOTO UNIV,INST CHEM RES,UJI,KYOTO 611,JAPAN

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1992年 / 75卷 / 02期

关键词：

D O I：

10.1111/j.1151-2916.1992.tb08205.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The local environment around copper in the Cu2O.Al2O3.4SiO2 and CuO.Al23.4SiO2 glasses was investigated using the extended X-ray absorption fine structure (EXAFS) technique. It has been found that each Cu(I) in the former glass is coordinated to two oxygens through covalent Cu(I)-O bonds. This is the primary reason for its low thermal expansion coefficient (approximately 10 x 10(-7) K-1). In the latter glass, which was made by heating the former glass at 600-degrees-C in air, each Cu(II) is coordinated to four oxygens and the bonds are ionic in character, contributing to the increase in the thermal expansion coefficient to approximately 30 x 10(-7) K-1.

引用

页码：477 / 478

页数：2

共 7 条

[1]

BAAK NTE, 1973, Patent No. 3779781

[2] MIGRATION OF CU+ IONS IN CU2O-AL2O3-SIO2 GLASSES ON HEATING IN AIR [J].