LASER-DRIVEN ELECTRON IONIZATION FOR A VUV PHOTOIONIZATION TIME-OF-FLIGHT MASS-SPECTROMETER

被引：26

作者：

BOYLE, JG ^{[1
]}

PFEFFERLE, LD ^{[1
]}

GULCICEK, EE ^{[1
]}

COLSON, SD ^{[1
]}

机构：

[1] YALE UNIV, DEPT CHEM, NEW HAVEN, CT 06510 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1991年 / 62卷 / 02期

关键词：

D O I：

10.1063/1.1142123

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The modification of a VUV photoionization time-of-flight mass spectrometer (TOF-MS) to accommodate pulsed electron ionization is described. Utilizing a selected wavelength from a UV or VUV laser, structurally important fragment ions can be created for mass analysis. Data are straightforwardly obtained with only minor modifications to the experimental apparatus. The electron energy is continuously adjustable, thereby allowing the extent of fragmentation to be controlled. Observed fragmentation patterns are quantitatively similar to conventional electron ionization. Performance using UV or VUV radiation as the photoelectric driver is adequate to perform pulsed electron ionization on a time scale compatible with TOF-MS.

引用

页码：323 / 333

页数：11

共 20 条

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[2]

Bittner J.D.D., 1981, P COMBUST INST, V18, P1105, DOI 10.1016/S0082-0784(81)80115-4

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