REMEASUREMENT OF GAMMA-RAY REFERENCE LINES

被引：130

作者：

DESLATTES, RD ^{[1
]}

KESSLER, EG ^{[1
]}

SAUDER, WC ^{[1
]}

HENINS, A ^{[1
]}

机构：

[1] VIRGINIA MIL INST, DEPT PHYS, LEXINGTON, VA 24450 USA

来源：

ANNALS OF PHYSICS | 1980年 / 129卷 / 02期

关键词：

D O I：

10.1016/0003-4916(80)90394-2

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：378 / 434

页数：57

共 97 条

[1] A DOUBLE CRYSTAL DIFFRACTION SPECTROMETER FOR STUDIES OF HIGH ENERGY GAMMA-RAYS RESULTING FROM THERMAL NEUTRON CAPTURE
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[6] PI--MASS AND VACUUM POLARIZATION - RE-EVALUATION
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[7] ABSOLUTE MEASUREMENT OF LATTICE-PARAMETER OF GERMANIUM USING MULTIPLE-BEAM X-RAY-DIFFRACTOMETRY
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[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1975, A 31 (MAY1): : 364 - 367
[8] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS
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[J]. REVIEWS OF MODERN PHYSICS, 1964, 36 (03) : 681 - &
[9] LEAD K ABSORPTION EDGE FOR MU-MESON MASS DETERMINATION
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[J]. PHYSICAL REVIEW LETTERS, 1960, 4 (05) : 240 - 241
[10] Shapes and wavelengths of K series lines of elements Ti 22 to Ge 32
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[J]. PHYSICAL REVIEW, 1935, 48 (01): : 18 - 30

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