DOUBLE RESOLUTION WITH A SISAM SPECTROMETER

[1] CONNES P, 1958, THESIS PARIS

[2] ABSOLUTE STANDARDIZATION OF A SISAM SPECTROMETER [J]. APPLIED OPTICS, 1970, 9 (07) : 1587 - +

[3] GRANER G, 1965, THESIS PARIS

[4] MEASUREMENT OF INTERFEROMETRIC SECONDARY WAVELENGTH STANDARDS IN THE NEAR INFRARED [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1956, 46 (07) : 477 - 484

[1] CONNES P, 1958, THESIS PARIS

[2] ABSOLUTE STANDARDIZATION OF A SISAM SPECTROMETER [J]. APPLIED OPTICS, 1970, 9 (07) : 1587 - +

[3] GRANER G, 1965, THESIS PARIS

[4] MEASUREMENT OF INTERFEROMETRIC SECONDARY WAVELENGTH STANDARDS IN THE NEAR INFRARED [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1956, 46 (07) : 477 - 484