SMALL-ANGLE X-RAY-SCATTERING STUDY OF THE FRACTAL MORPHOLOGY OF POROUS SILICAS

被引：31

作者：

SCHMIDT, PW

HOHR, A

NEUMANN, HB

KAISER, H

AVNIR, D

LIN, JS

机构：

[1] HEBREW UNIV JERUSALEM,F HABER RES CTR MOLEC DYNAM,IL-91904 JERUSALEM,ISRAEL

[2] HEBREW UNIV JERUSALEM,DEPT ORGAN CHEM,IL-91904 JERUSALEM,ISRAEL

[3] OAK RIDGE NATL LAB,NATL CTR SMALL ANGLE SCATTERING RES,OAK RIDGE,TN 37831

来源：

JOURNAL OF CHEMICAL PHYSICS | 1989年 / 90卷 / 09期

关键词：

D O I：

10.1063/1.456544

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：5016 / 5023

页数：8

共 65 条

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