DETERMINATION OF GOLD-LAYER AND DEAD-LAYER THICKNESSES FOR A SI(LI) DETECTOR

被引：14

作者：

MUSKET, RG ^{[1
]}

BAUER, W ^{[1
]}

机构：

[1] SANDIA LABS,LIVERMORE,CA 94550

来源：

NUCLEAR INSTRUMENTS & METHODS | 1973年 / 109卷 / 03期

关键词：

D O I：

10.1016/0029-554X(73)90581-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：593 / 595

页数：3

共 11 条

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[8] SOME ASPECTS OF X-RAY-FLUORESCENCE SPECTROMETERS FOR TRACE-ELEMENT ANALYSIS [J].

LANDIS, DA ;

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JARRETT, BV .

NUCLEAR INSTRUMENTS & METHODS, 1972, 101 (01) :127-+

[9] OXIDE-THICKNESS DETERMINATION BY PROTON-INDUCED X-RAY-FLUORESCENCE [J].

MUSKET, RG ;

BAUER, W .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (11) :4786-&

[10]

MUSKET RG, TO BE PUBLISHED

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