DETERMINATION OF THE SURFACE RELAXATION OF SC(0001) BY VIDEO LEED ANALYSIS

被引：6

作者：

BARRETT, SD ^{[1
]}

DHESI, SS ^{[1
]}

EVANS, MP ^{[1
]}

WHITE, RG ^{[1
]}

机构：

[1] UNIV LIVERPOOL, DEPT PHYS, LIVERPOOL L69 3BX, ENGLAND

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1993年 / 4卷 / 01期

关键词：

D O I：

10.1088/0957-0233/4/1/019

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We describe a low-cost system of video data acquisition as an extension to qualitative LEED StUdies that allows quantitative LEED intensity-voltage (I-V) analysis. The type of equipment used and the procedures developed to align the samples, acquire the data, extract the LEED SpOt intensities and determine the surface layer spacing from a simple kinematic analysis are outlined. As a test case, we determine the surface layer spacing d12 of the rare earth metal Sc(0001) using kinematic analysis of I-V spectra of the (00) LEED Spot. Values derived from spectra taken on different days are reproducible to within 0.5% (about 1 pm), and the mean value of d12 is found to be 0.2633 +/- 0.0005 nm. This compares to the spacing for bulk Sc of 0.2634 nm, indicating that there is no surface relaxation.

引用

页码：114 / 119

页数：6

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