X-RAY PHOTOELECTRON SPECTROMETER DESIGNED FOR SURFACE RESEARCH

被引：18

作者：

FRASER, WA ^{[1
]}

FLORIO, JV ^{[1
]}

DELGASS, WN ^{[1
]}

ROBERTSON, WD ^{[1
]}

机构：

[1] YALE UNIV, DEPT ENGN & APPL SCI, NEW HAVEN, CT 06520 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1973年 / 44卷 / 10期

关键词：

D O I：

10.1063/1.1685981

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：1490 / 1496

页数：7

相关论文

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