MEASUREMENT OF HEAT-CAPACITY OF SEMICONDUCTING MATERIALS BY DIRECT HEATING PULSE METHOD AT HIGH-TEMPERATURES

A direct heating pulse calorimeter was designed and constructed for measuring the heat capacity of semiconducting materials at high temperatures. Heat leak from the sample to the surroundings due to the increasing radiation at high temperatures was reduced by providing an adiabatic shield to enclose the sample. The error of the method has been analysed, and the condition for measurement of the heat capacity with a limited inaccuracy is discussed. It is shown that a sample with electrical conductivity in the range from 10 -1 to 106 Omega -1 m-1 can be measured with an imprecision of less than 0.5% at 1000K.