EFFECT OF PHOTOCARRIERS ON SURFACE BARRIER ELECTROREFLECTANCE IN MOS CAPACITOR CONFIGURATIONS

被引：4

作者：

BOTTKA, N ^{[1
]}

机构：

[1] MICHELSON LAB, PHYS DIV, CHINA LAKE, CA 93555 USA

来源：

JOURNAL OF APPLIED PHYSICS | 1973年 / 44卷 / 12期

关键词：

D O I：

10.1063/1.1662211

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：5626 / 5628

页数：3

共 14 条

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[8] MOS CAPACITORS FOR SURFACE BARRIER ELECTROREFLECTANCE MEASUREMENTS [J].

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[9]

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[10] FIELD INHOMOGENEITY IN ELECTROREFLECTANCE [J].

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