A SIMPLE IN-SITU CALIBRATION TECHNIQUE FOR SOFT-X-RAY FILM

被引：10

作者：

LU, PX

FAN, PZ

XU, ZZ

LI, RX

WANG, XF

LI, YL

ZHANG, ZQ

CHEN, SS

机构：

[1] Shanghai Institute of Optics and Fine Mechanics, Academia Sinica, Shanghai 201800

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 10期

关键词：

D O I：

10.1063/1.1144376

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A simple valid in situ relative intensity calibration technique for soft x-ray film is described. This is based on film exposure measurements of the uniform line-shaped distributed soft x-ray monochromatic irradiation transmitted through a step-wedge absorption filter. Fitting the calibration data with Henke's semiempirical equation for thick-emulsion film, the characteristic curves for Shanghai 5F soft x-ray film without supercoat (SIOM-5FW) have been obtained in the wavelength region from 50 to 80 angstrom.

引用

页码：2879 / 2882

页数：4

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