PLANARIZATION AND FABRICATION OF BRIDGES ACROSS DEEP GROOVES OR HOLES IN SILICON USING A DRY FILM PHOTORESIST FOLLOWED BY AN ETCH BACK

被引:5
作者
SPIERING, VL
BERENSCHOT, JW
ELWENSPOEK, M
机构
[1] MESA Res. Inst., Twente Univ., Enschede
关键词
D O I
10.1088/0960-1317/5/2/036
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A technique is presented that provides planarization after a very deep etching step in silicon. This offers the possibility for not only resist spinning and layer patterning but also for realization of bridges and cantilevers across deep grooves or holes. The technique contains a standard dry film lamination step to cover a wafer with a 38 mu m thick foil. Next the foil is etched back to the desired thickness of a few micrometres. This thin film facilitates resist spinning and high-resolution patterning. The planarization method is demonstrated by the fabrication of aluminium bridges across a deep groove in silicon.
引用
收藏
页码:189 / 192
页数:4
相关论文
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