SEMICONDUCTOR PHOTOELASTIC CONSTANTS MEASURED BY LIGHT-SCATTERING IN SUPERLATTICES

被引:13
作者
HE, J [1 ]
SAPRIEL, J [1 ]
BRUGGER, H [1 ]
机构
[1] TECH UNIV MUNICH, DEPT PHYS E16, D-8046 GARCHING, FED REP GER
关键词
D O I
10.1103/PhysRevB.39.5919
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:5919 / 5923
页数:5
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