ANALYSIS OF X-RAY AND ELECTRON-BEAM DIFFRACTION PATTERNS FROM POLY(DIPROPYL-SILOXAND)

被引：15

作者：

PETERSEN, DR

CARTER, DR

LEE, CL

机构：

[1] Chemical Physics Research Laboratory, The Dow Chemical Company, Midland, Michigan

[2] Dow Corning Corporation, Midland, Michigan

来源：

JOURNAL OF MACROMOLECULAR SCIENCE-PHYSICS | 1969年 / B 3卷 / 03期

关键词：

D O I：

10.1080/00222346908217104

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

The crystalline polysiloxane (—R2SiO—)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data is tetragonal, with dimensions a = 9.52 • 0.01 and c = 9.40 ± 0.05. The probable space group is P41 (or P43). © 1969, Taylor & Francis Group, LLC. All rights reserved.

引用

页码：519 / &