TENSILE STRENGTH OF SAPPHIRE WHISKERS AT ELEVATED TEMPERATURES

被引:12
作者
BAYER, PD
COOPER, RE
机构
[1] Metallurgy Division, Atomic Weapons Research Establishment, Aldermaston, Berks
关键词
D O I
10.1007/BF00555042
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Tensile tests have been carried out on 124 sapphire whiskers at temperatures in the range 350 to 1810° C. The effects of crystallographic orientation, growth process, purity and surface perfection have been investigated. The strength-temperature-dependences of different categories of whisker are compared with that to be expected for a Griffith fracture mechanism, and it is shown that such a mechanism may apply up to ∼1000° C to A-type (<hk.o>) whiskers grown by the wet-hydrogen process [1]. Chemically-polished whiskers of this type show a strength-temperature-dependence more consistent with a dislocation-induced fracture mechanism. There is some evidence that chemically-polished C-type (<0001>) whiskers grown by a chloride oxidation process [2] behave in the same manner. For other categories of whisker there are insufficient data to ascribe fracture mechanisms. © 1969 Chapman and Hall.
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页码:15 / &
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