GAMMA-SPECTROMETRIC AND RADIOCHEMICAL ANALYSIS FOR IMPURITIES IN ULTRAPURE SILICON

被引：37

作者：

THOMPSON, BA

STRAUSE, BM

LEBOEUF, MB

机构：

来源：

ANALYTICAL CHEMISTRY | 1958年 / 30卷 / 06期

关键词：

D O I：

10.1021/ac60138a003

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1023 / 1027

页数：5

共 11 条

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[9] ACTIVATION ANALYSIS OF TRACE IMPURITIES IN SILICON USING SCINTILLATION SPECTROMETRY [J].

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