CHARACTERISTICS OF HIGH-PERFORMANCE YBA2CU3O7 STEP-EDGE JUNCTIONS

被引：49

作者：

LUINE, J ^{[1
]}

BULMAN, J ^{[1
]}

BURCH, J ^{[1
]}

DALY, K ^{[1
]}

LEE, A ^{[1
]}

PETTIETTEHALL, C ^{[1
]}

SCHWARZBEK, S ^{[1
]}

MILLER, D ^{[1
]}

机构：

[1] ARGONNE NATL LAB,DIV MAT SCI,ARGONNE,IL 60439

来源：

APPLIED PHYSICS LETTERS | 1992年 / 61卷 / 09期

关键词：

D O I：

10.1063/1.107690

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Step-edge Josephson junctions are engineered grain boundary junctions fabricated using standard lithographic and film deposition techniques. We report a systematic study of 180 YBa2Cu3O7 step-edge junctions and identify a fabrication technique which results in a 90% yield of working junctions with critical current spreads from 30% to 50% (1-sigma/I(c-ave)) over the entire substrate. Technically useful critical current values at 65 K can be obtained by adjusting YBa2Cu3O7 film thickness. I(c)R(n) values, approximately independent of film thickness, are approximately 1 mV at 4.2 K and approximately 0.1 mV at 65 K. Most junctions exhibit ideal electrical behavior in accordance with the RSJ model.

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页码：1128 / 1130

页数：3

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