PROXIMITY EFFECT IN THIN-SUPERCONDUCTOR LIMIT

被引：6

作者：

TODD, RJ ^{[1
]}

CHEN, JT ^{[1
]}

KIM, YW ^{[1
]}

机构：

[1] WAYNE STATE UNIV,DEPT PHYS,DETROIT,MI 48202

来源：

PHYSICAL REVIEW B | 1973年 / 7卷 / 01期

关键词：

D O I：

10.1103/PhysRevB.7.150

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：150 / 156

页数：7

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