RESONANCE RAMAN-SCATTERING NEAR CRITICAL-POINTS

被引：82

作者：

MARTIN, RM ^{[1
]}

机构：

[1] XEROX CORP,RES CTR,PALO ALTO,CA 94304

来源：

PHYSICAL REVIEW B | 1974年 / 10卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.10.2620

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2620 / 2631

页数：12

共 28 条

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[5]

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[10]

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