ANALYSIS OF SUBSURFACE IMAGING AND EFFECT OF CONTACT ELASTICITY IN THE ULTRASONIC FORCE MICROSCOPE

被引:65
作者
YAMANAKA, K
OGISO, H
KOLOSOV, O
机构
[1] JOINT RES CTR ATOM TECHNOL,TSUKUBA,IBARAKI 305,JAPAN
[2] ANGSTROM TECHNOL PARTNERSHIP,TSUKUBA,IBARAKI 305,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 5B期
关键词
ELASTICITY; SURFACE ENERGY; ATOMIC FORCE MICROSCOPE; SUBSURFACE IMAGING; HERTZIAN CONTACT; ULTRASONIC FORCE MICROSCOPY;
D O I
10.1143/JJAP.33.3197
中图分类号
O59 [应用物理学];
学科分类号
摘要
We examined, both theoretically and experimentally, the characteristics of subsurface imaging with nanometer resolution and the effect of contact elasticity in the ultrasonic force microscope (UFM). In particular, the effect of the surface energy and effective elasticity on the maximum tip-sample force and the shift of the averaged tip-sample distance were examined. Furthermore, kink formation in the cantilever deflection (z(a)) against the ultrasonic frequency vibration (UFV) amplitude (a) characteristics was predicted. This model was used to explain experimental observations in UFM, such as the features of the measured z(a)(a) curve and the damping of the cantilever torsion vibration by the UFV. Moreover. the previously reported lateral ultrasonic force microscope image of subsurface features was explained by the response of subsurface edge dislocation to a large instantaneous force enhanced by the UFV.
引用
收藏
页码:3197 / 3203
页数:7
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