MEASUREMENT OF LASER-PLASMA ELECTRON-DENSITY WITH A SOFT-X-RAY LASER DEFLECTOMETER

被引：71

作者：

RESS, D ^{[1
]}

DASILVA, LB ^{[1
]}

LONDON, RA ^{[1
]}

TREBES, JE ^{[1
]}

MROWKA, S ^{[1
]}

PROCASSINI, RJ ^{[1
]}

BARBEE, TW ^{[1
]}

LEHR, DE ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT PHYS,STANFORD,CA 94305

来源：

SCIENCE | 1994年 / 265卷 / 5171期

关键词：

D O I：

10.1126/science.265.5171.514

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

A soft x-ray laser (wavelength lambda = 15.5 nanometers) was used to create a moire deflectogram of a high-density, laser-produced plasma. The use of deflectometry at this short wavelength permits measurement of the density spatial profile in a long-scalelength (3 millimeters), high-density plasma. A peak density of 3.2 x 10(21) per cubic centimeter was recorded.

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页码：514 / 517

页数：4

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