SYNTHESIS AND CHARACTERIZATION OF FLASH-EVAPORATED MOO3 THIN-FILMS

被引：188

作者：

JULIEN, C ^{[1
]}

KHELFA, A ^{[1
]}

HUSSAIN, OM ^{[1
]}

NAZRI, GA ^{[1
]}

机构：

[1] GM CORP,RES LABS,DEPT PHYS CHEM,WARREN,MI 48090

来源：

JOURNAL OF CRYSTAL GROWTH | 1995年 / 156卷 / 03期

关键词：

D O I：

10.1016/0022-0248(95)00269-3

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Molybdenum trioxide with an orthorhombic symmetry is one of the most interesting layered intercalation materials because of its use in solid state batteries and display systems. In the present investigation, thin films of MoO3 were prepared by flash-evaporation technique on silica glass and silicon substrates maintained at different temperatures, T-s, in the range of 30-300 degrees C. The films were systematically characterized by studying their structural, optical and electrical properties. X-ray diffraction and SEM analysis showed that films have an orthorhombic layered structure. The Raman scattering and infrared absorption were studied to establish the T-s dependence of the film properties. The energy gap of MoO3 films is located between 2.8 and 3.2 eV depending on the substrate and annealing temperature. AC and DC conductivities were measured as a function of T-s. The effect of annealing treatment was also investigated.

引用

页码：235 / 244

页数：10

共 34 条

[1] ON THE CRYSTAL STRUCTURE OF MOLYBDENUM TRIOXIDE [J].