ELECTROREFLECTANCE STUDY OF NIO

被引：46

作者：

MCNATT, JL

机构：

[1] Advanced Materials Research, Development Laboratory, Pratt and Whitney Aircraft, Middletown

来源：

PHYSICAL REVIEW LETTERS | 1969年 / 23卷 / 16期

关键词：

D O I：

10.1103/PhysRevLett.23.915

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

By using a thin NiO single-crystal sample, it has been possible to observe electroreflectance spectra between 3.0 and 5.0 eV. The results of this study and a recent photoconductivity investigation suggest that an energy-band description which includes the 3d electrons is necessary for a full description of NiO interband optical properties. © 1969 The American Physical Society.

引用

页码：915 / &

共 20 条

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