A SEMI-EMPIRICAL METHOD TO CORRECT FOR MULTIPLE-SCATTERING EFFECTS IN COMPTON PROFILE MEASUREMENTS

被引：12

作者：

FELSTEINER, J ^{[1
]}

PATTISON, P ^{[1
]}

机构：

[1] HAHN MEITNER INST KERNFORSCH BERLIN GMBH,D-1000 BERLIN 39,FED REP GER

来源：

NUCLEAR INSTRUMENTS & METHODS | 1980年 / 173卷 / 02期

关键词：

D O I：

10.1016/0029-554X(80)90787-9

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：323 / 327

页数：5

共 14 条

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PATTISON, P .

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[9] PERFORMANCE OF A GAMMA-RAY COMPTON SPECTROMETER FOR MOMENTUM DENSITY STUDIES [J].

PATTISON, P ;

SCHNEIDER, JR .

NUCLEAR INSTRUMENTS & METHODS, 1979, 158 (01) :145-152

[10] MOMENTUM DENSITIES AND COMPTON PROFILES OF DIAMOND, SILICON AND SILICON-CARBIDE [J].

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ELLIS, DE .

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