CHARGED-PARTICLE ACTIVATION-ANALYSIS

[1] ALBERT P, 1968, EUR3896 DFE EUR REP, P3

[2] 7ICROANALYSIS BY DIRECT OBSERVATION OF NUCLEAR REACTIONS USING A 2 MEV VAN-DE-GRAAFF [J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 92 (04): : 481 - &

[3] BARRANDON JN, 1969, NBS312 SPEC PUBL, V2, P794

[4] BOGH E, 1967, BNL50083, P76

[5] COOKSON JA, 1970, R6300 AERE REP

[6] ION IMPLANTATION OF SILICON .I. ATOM LOCATION AND LATTICE DISORDER BY MEANS OF 1.0-MEV HELIUM ION SCATTERING [J]. CANADIAN JOURNAL OF PHYSICS, 1967, 45 (12) : 4053 - &

[7] RUTHERFORD SCATTERING AND CHANNELING - USEFUL COMBINATION FOR STUDYING CRYSTAL SURFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (03): : 487 - &

[8] DEBRUN JC, 1969, NBS312 SPEC PUBL, V2, P774

[9] MICROACTIVATION ANALYSIS FOR OXYGEN IN ACTINIDE METALS [J]. ANALYTICAL CHEMISTRY, 1963, 35 (09) : 1228 - &

[10] OXYGEN DETERMINATION IN SODIUM BY PROTON ACTIVATION [J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1970, 6 (01): : 227 - +

[1] ALBERT P, 1968, EUR3896 DFE EUR REP, P3

[2] 7ICROANALYSIS BY DIRECT OBSERVATION OF NUCLEAR REACTIONS USING A 2 MEV VAN-DE-GRAAFF [J]. NUCLEAR INSTRUMENTS & METHODS, 1971, 92 (04): : 481 - &

[3] BARRANDON JN, 1969, NBS312 SPEC PUBL, V2, P794

[4] BOGH E, 1967, BNL50083, P76

[5] COOKSON JA, 1970, R6300 AERE REP

[6] ION IMPLANTATION OF SILICON .I. ATOM LOCATION AND LATTICE DISORDER BY MEANS OF 1.0-MEV HELIUM ION SCATTERING [J]. CANADIAN JOURNAL OF PHYSICS, 1967, 45 (12) : 4053 - &

[7] RUTHERFORD SCATTERING AND CHANNELING - USEFUL COMBINATION FOR STUDYING CRYSTAL SURFACES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1971, 8 (03): : 487 - &

[8] DEBRUN JC, 1969, NBS312 SPEC PUBL, V2, P774

[9] MICROACTIVATION ANALYSIS FOR OXYGEN IN ACTINIDE METALS [J]. ANALYTICAL CHEMISTRY, 1963, 35 (09) : 1228 - &

[10] OXYGEN DETERMINATION IN SODIUM BY PROTON ACTIVATION [J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1970, 6 (01): : 227 - +