APPLICATION OF A PRECISE DOUBLE X-RAY SPECTROMETER FOR ACCURATE LATTICE-PARAMETER DETERMINATION

被引：29

作者：

GODWOD, K

KOWALCZYK, R

SZMID, Z

机构：

[1] POLISH ACAD SCI, INST PHYS, WARSAW, POLAND

[2] INST NUCL RES, SWIERK, POLAND

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1974年 / 21卷 / 01期

关键词：

D O I：

10.1002/pssa.2210210124

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：227 / 234

页数：8

相关论文

共 11 条

[1] Shapes and wavelengths of K series lines of elements Ti 22 to Ge 32
Bearden, JA
Shaw, CH
[J]. PHYSICAL REVIEW, 1935, 48 (01): : 18 - 30
[2] X-RAY WAVELENGTHS
BEARDEN, JA
[J]. REVIEWS OF MODERN PHYSICS, 1967, 39 (01) : 78 - &
[3] PRECISION LATTICE CONSTANT DETERMINATION
BOND, WL
[J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 814 - 818
[4] A CONTRIBUTION TO THEORY OF TRIPLE CRYSTAL DIFFRACTOMETER
BUBAKOVA, R
FINGERLAND, A
DRAHOKOUPIL, J
[J]. CZECHOSLOVAK JOURNAL OF PHYSICS, 1961, 11 (03) : 205 - +
[5] EXACT ADJUSTMENT OF MONOCRYSTALS ON MANY-CRYSTAL X-RAY EQUIPMENT
BUBAKOVA, R
[J]. CZECHOSLOVAK JOURNAL OF PHYSICS, 1962, 12 (09) : 695 - &
[6] SOME PROPERTIES OF SINGLE-CRYSTAL ROCKING CURVE IN BRAGG CASE
FINGERLA.A
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAY1) : 280 - &
[7] EQUATION FOR DOUBLE-CRYSTAL SPECTROMETER WITH ASYMMETRICAL CRYSTALS
FINGERLAND, A
[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1972, 13 (02): : 669 - +
[8] Godwod K., 1970, Physica Status Solidi A, V2, P235, DOI 10.1002/pssa.19700020207
[9] GODWOD K, IN PRESS
[10] INTENSITY OF X-RAY REFLEXION FROM PERFECT AND MOSAIC ABSORBING CRYSTALS
HIRSCH, PB
RAMACHANDRAN, GN
[J]. ACTA CRYSTALLOGRAPHICA, 1950, 3 (03): : 187 - 194