HIGH-SENSITIVITY-COHERENT OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY FOR CHARACTERIZATION OF FIBEROPTIC NETWORK COMPONENTS

被引:23
作者
PASSY, R [1 ]
GISIN, N [1 ]
VONDERWEID, JP [1 ]
机构
[1] UNIV GENEVA,APPL PHYS GRP,CH-1211 GENEVA 4,SWITZERLAND
关键词
D O I
10.1109/68.388759
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have performed high-sensitivity-coherent optical frequency-domain reflectometry (OFDR) measurements of pigtailed optical devices with centimeter resolution. The oscillations of the Rayleigh backscattering level produced by coherent fading noise was eliminated, strongly improving the capabitlity of OFDR measurements of low level reflections and losses, Sensitivities down to -105 dB were achieved with minute measurement times.
引用
收藏
页码:667 / 669
页数:3
相关论文
共 8 条
[1]   OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY IN SINGLE-MODE FIBER [J].
EICKHOFF, W ;
ULRICH, R .
APPLIED PHYSICS LETTERS, 1981, 39 (09) :693-695
[2]   SUBMILLIMETER OPTICAL REFLECTOMETRY [J].
GILGEN, HH ;
NOVAK, RP ;
SALATHE, RP ;
HODEL, W ;
BEAUD, P .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1989, 7 (08) :1225-1233
[3]   COHERENT FREQUENCY-DOMAIN REFLECTOMETRY FOR CHARACTERIZATION OF SINGLE-MODE INTEGRATED-OPTICAL WAVE-GUIDES [J].
GLOMBITZA, U ;
BRINKMEYER, E .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1993, 11 (08) :1377-1384
[4]  
MIYAMOTO K, 1994, LASER FOCUS WORLD, V30, P81
[5]   EXPERIMENTAL AND THEORETICAL INVESTIGATIONS OF COHERENT OFDR WITH SEMICONDUCTOR-LASER SOURCES [J].
PASSY, R ;
GISIN, N ;
VONDERWEID, JP ;
GILGEN, HH .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1994, 12 (09) :1622-1630
[6]   CHARACTERISTICS AND REDUCTION OF COHERENT FADING NOISE IN RAYLEIGH BACKSCATTERING MEASUREMENT FOR OPTICAL FIBERS AND COMPONENTS [J].
SHIMIZU, K ;
HORIGUCHI, T ;
KOYAMADA, Y .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1992, 10 (07) :982-988
[7]   JAGGED APPEARANCE OF RAYLEIGH-BACKSCATTER SIGNAL IN ULTRAHIGH-RESOLUTION OPTICAL TIME-DOMAIN REFLECTOMETRY BASED ON LOW-COHERENCE INTERFERENCE [J].
TAKADA, K ;
HIMENO, A ;
YUKIMATSU, K .
OPTICS LETTERS, 1991, 16 (18) :1433-1435
[8]   HIGH-SENSITIVITY LOW COHERENCE REFLECTOMETER USING ERBIUM-DOPED SUPERFLUORESCENT FIBER SOURCE AND ERBIUM-DOPED POWER-AMPLIFIER [J].
TAKADA, K ;
KITAGAWA, T ;
SHIMIZU, M ;
HORIGUCHI, M .
ELECTRONICS LETTERS, 1993, 29 (04) :365-367