DETERMINATION OF BOND STRENGTHS OF ARSENIC AND ARSENIC CHALCOGEN COMPOUNDS USING THE TEMPERATURE-DEPENDENCE OF EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE

被引：38

作者：

YANG, CY

PAESLER, MA

SAYERS, DE

机构：

来源：

PHYSICAL REVIEW B | 1987年 / 36卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.36.980

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：980 / 988

页数：9

共 33 条

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