BROAD-BAND COMPLEX PERMITTIVITY MEASUREMENTS BY TIME-DOMAIN SPECTROSCOPY

被引：80

作者：

NOZAKI, R

BOSE, TK

机构：

[1] Groupe de Recherche sur les Dielectriques, Department de Physique, Universite du Quebec a Trois-Rivieres, Trois-Rivieres, Quebec

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1990年 / 39卷 / 06期

关键词：

D O I：

10.1109/19.65803

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Recent improvements in time-domain reflectometry (TDR) have made it possible to make precise measurements of complex permittivity over a wide frequency range from about 100 kHz to 25 GHz. Hardware development in sampling techniques and digital processing has brought a new generation of measurements. Powerful software developments have been realized by the use of the reflection method. This approach, including complete use of basic transmission line theory and some high frequency corrections, have made it possible to make complex permittivity measurement of materials, even with large dc conductivity. Application of the TDR technique in the field of liquids, liquid crystals, and microemulsions is discussed. © 1990 IEEE

引用

页码：945 / 951

页数：7

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