ON THE CORRECTION FOR MULTIPLE-SCATTERING OF LINEARLY POLARIZED X-RAYS IN COMPTON PROFILE MEASUREMENTS

被引:7
作者
BELL, F [1 ]
FELSTEINER, J [1 ]
机构
[1] TECHNION ISRAEL INST TECHNOL,DEPT PHYS,IL-32000 HAIFA,ISRAEL
关键词
D O I
10.1016/0168-583X(95)00567-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A Monte Carlo calculation for the multiple scattering of linearly polarized X-rays in graphite targets of varying thickness has been made. Special attention has been devoted to the polarization dependence of the scattering process. Results are given in terms of Stokes parameters for both the primary and scattered radiation. We describe the correction procedure for Compton profile measurements especially in view of the polarization dependence of photon detectors in Bragg spectrometers. An experimental setup is recommended which minimizes the influence of multiple scattering.
引用
收藏
页码:379 / 387
页数:9
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