CALIBRATION OF ATOM PROBE FIM

被引：37

作者：

PANITZ, JA

MCLANE, SB

MULLER, EW

机构：

来源：

关键词：

D O I：

10.1063/1.1683774

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1321 / &

共 8 条

[1] MASS SPECTROMETRIC ANALYSIS OF LOW TEMPERATURE FIELD EVAPORATION
BAROFSKY, DF
MULLER, EW
[J]. SURFACE SCIENCE, 1968, 10 (02) : 177 - &
[2] ON IONIZATION STATE OF FIELD EVAPORATED ATOMS AS MEASURED IN FIM-ATOM PROBE
BRENNER, SS
MCKINNEY, JT
[J]. APPLIED PHYSICS LETTERS, 1968, 13 (01) : 29 - &
[3] ATOM-PROBE FIELD ION MICROSCOPE
MULLER, EW
PANITZ, JA
MCLANE, SB
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (01) : 83 - &
[4] FIELD-ION MICROSCOPY AND ELECTRONIC STRUCTURE OF METAL SURFACES
MULLER, EW
[J]. QUARTERLY REVIEWS, 1969, 23 (02): : 177 - &
[5] MULLER EW, TO BE PUBLISHED
[6] MULLER EW, 1960, ADV ELECTRON, V13, P129
[7] MULLER EW, 1968, EUROPEAN REGIONAL C, V1, P135
[8] SCARBOROUGH JB, 1966, NUMERICAL MATH ANAL, P215