ANALYSIS OF CRITICAL-EXPONENT DATA USING EFRONS BOOTSTRAP TECHNIQUE

被引：6

作者：

CRARY, SB

FAHEY, DA

机构：

[1] AMHERST COLL,DEPT PHYS,AMHERST,MA 01002

[2] UNIV MASSACHUSETTS,DEPT PHYS & ASTRON,LOW TEMP PHYS LAB,AMHERST,MA 01003

来源：

PHYSICAL REVIEW B | 1987年 / 35卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.35.2102

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2102 / 2104

页数：3

共 18 条

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