INCREASE OF TRUE DOUBLE-ELECTRON-CAPTURE CROSS-SECTIONS IN SLOW XE-Q+ -(XE,HE) COLLISIONS AT VERY HIGH-Q

被引：34

作者：

CEDERQUIST, H

ANDERSSON, H

BEEBE, E

BIEDERMANN, C

BROSTROM, L

ENGSTROM, A

GAO, H

HUTTON, R

LEVIN, JC

LILJEBY, L

PAJEK, M

QUINTEROS, T

SELBERG, N

SIGRAY, P

机构：

[1] Manne Siegbahn Institute of Physics

来源：

PHYSICAL REVIEW A | 1992年 / 46卷 / 05期

关键词：

D O I：

10.1103/PhysRevA.46.2592

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have measured cross sections for true double-electron capture (DC) and transfer ionization (TI) in slow Xe(q+)-(Xe,He) collisions in the charge-state regime 15 less-than-or-equal-to q less-than-or-equal-to 42. We find that the probabilities for radiative stabilization P(rad)=sigma(DC)/(sigma(DC)+sigma(TI)) increase rapidly with q for q greater-than-or-equal-to 28 and are very similar for two-electron transfer from Xe and He. This surprising similarity indicates that the core structure of the projectile, rather than the initially populated capture state, is decisive for the electronic relaxation process.

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页码：2592 / 2595

页数：4

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