DETERMINATION OF THE MORPHOLOGY OF AG DEPOSITS BY PHOTOREFLECTANCE

被引：15

作者：

BORENSZTEIN, Y

ALAMEH, R

ROY, M

机构：

[1] Laboratoire d'Optique des Solides, Université Pierre et Marie Curie, 75252 Paris Cedex 05, Case 80, place Jussieu

来源：

PHYSICAL REVIEW B | 1994年 / 50卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.50.1973

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The optical response of one Ag monolayer deposited on different Si surfaces has been studied by differential reflectance spectroscopy. The observation of the plasma resonance in the Ag deposits and its energy position, or the nonobservation of this plasma resonance, allows a qualitative determination of the morphology of the thin Ag film: either continuous or formed by quasispherical particles or by flattened three-dimensional particles.

引用

页码：1973 / 1975

页数：3

共 15 条

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