INFLUENCE OF LAYER THICKNESS ON THE QUALITY OF MERCURY CADMIUM TELLURIDE EPILAYERS GROWN BY THE INTERDIFFUSED MULTILAYER PROCESS

被引：8

作者：

RACCAH, PM ^{[1
]}

ZHANG, Z ^{[1
]}

GARLAND, JW ^{[1
]}

CHU, AHM ^{[1
]}

BEVAN, MJ ^{[1
]}

THOMPSON, J ^{[1
]}

WOODHOUSE, KT ^{[1
]}

机构：

[1] GEC RES LABS,HIRST RES CTR,WEMBLEY HA9 7PP,MIDDX,ENGLAND

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 04期

关键词：

D O I：

10.1116/1.574059

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2226 / 2229

页数：4

共 5 条

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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (04) :2217-2225

[2]

MULLIN JB, 1985, 1985 US WORKSH PHYS

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UGUR, S ;

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[4] A NEW MOVPE TECHNIQUE FOR THE GROWTH OF HIGHLY UNIFORM CMT [J].

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[5] ELLIPSOMETRIC STUDIES OF ELECTRONIC INTERBAND-TRANSITIONS IN CDXHG1-XTE [J].

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PHYSICAL REVIEW B, 1984, 29 (12) :6752-6760

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