ANALYSIS OF DETERIORATION IN IN SOLDER FOR GAALAS DH LASERS

被引:20
作者
FUJIWARA, K
IMAI, H
FUJIWARA, T
HORI, K
TAKUSAGAWA, M
机构
[1] Fujitsu Laboratories Limited, Nakahara-ku, Kawasaki 211
关键词
D O I
10.1063/1.90984
中图分类号
O59 [应用物理学];
学科分类号
摘要
The deterioration of In solder associated with the degradation of GaAlAs DH lasers has been investigated. The deterioration of In solder is found to be caused by the diffusion of Au atoms into In solder. The increase in the thermal resistance of DH lasers is observed for the storage test. The increase in the thermal resistance is caused by the formation of the intermetallics between In and Au, which is thermally activated.
引用
收藏
页码:861 / 863
页数:3
相关论文
共 5 条