DIELECTRIC PERMITTIVITY MEASUREMENTS AT CENTIMETER WAVELENGTHS

被引：16

作者：

CUTNELL, JD

KRANBUEH, DE

TURNER, EM

VAUGHAN, WE

机构：

[1] Department of Physics, Southern Illinois University, Carbondale

[2] Department of Chemistry, University of Wisconsin, Madison

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1969年 / 40卷 / 07期

关键词：

D O I：

10.1063/1.1684102

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Improved apparatus for dielectric permittivity measurements at centimeter wavelengths is described. A method of data reduction which minimizes the effect of systematic errors, helps to average out random errors, and is free from significant mathematical approximations is presented. This method is compared to data reduction techniques common in the literature. © 1969 The American Institute of Physics.

引用

页码：908 / &

共 7 条

[1]

CUTNELL JD, 1967, THESIS U WISCONSIN

[2]

DAVIES M, 1969, DIELECTRIC PROPERTIE, pCH2

[3] MICROWAVE ABSORPTION AND MOLECULAR STRUCTURE IN LIQUIDS .63. DIELECTRIC BEHAVIOR OF RIGID POLAR MOLECULES AT 2.2-MM WAVELENGTH AND ATOMIC POLARIZATION [J].