DIFFRACTION-ANALYSIS AND MOSSBAUER-ANALYSIS OF SNOX FILMS

被引：10

作者：

NEUMANN, HG ^{[1
]}

ZEGGEL, P ^{[1
]}

MELZER, K ^{[1
]}

机构：

[1] KARL MARX UNIV,SEKT PHYS,DDR-7010 LEIPZIG,GER DEM REP

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1989年 / 108卷 / 01期

关键词：

D O I：

10.1016/0022-3093(89)90340-2

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：128 / 134

页数：7

共 34 条

[1] MOSSBAUER-EFFECT STUDIES OF LATTICE-DYNAMICS OF GRANULAR TIN
AKSELROD, S
PASTERNAK, M
BUKSHPAN, S
[J]. PHYSICAL REVIEW B, 1975, 11 (03): : 1040 - 1044
[2] ALENKINA KV, 1977, IZV AKAD NAUK SSSR N, V13, P1830
[3] PROPERTIES OF TIN OXIDE-FILMS PREPARED BY REACTIVE ELECTRON-BEAM EVAPORATION
BANERJEE, R
DAS, D
[J]. THIN SOLID FILMS, 1987, 149 (03) : 291 - 301
[4] UBER DIE VERFEINERUNG DER KRISTALLSTRUKTURBESTIMMUNG EINIGER VERTRETER DES RUTILTYPS - TIO2, SNO2, GEO2 UND MGF2
BAUR, WH
[J]. ACTA CRYSTALLOGRAPHICA, 1956, 9 (05): : 515 - 520
[5] INFLUENCE OF ANNEALING ON THE PHASE-COMPOSITION, TRANSMISSION AND RESISTIVITY OF SNOX THIN-FILMS
BEENSHMARCHWICKA, G
KROLSTEPNIEWSKA, L
MISIUK, A
[J]. THIN SOLID FILMS, 1984, 113 (03) : 215 - 224
[6] BOND VALENCE AS AN AID TO UNDERSTANDING STEREOCHEMISTRY OF O AND F COMPLEXES OF SN(II), SB(III), TE(IV), I(V) AND XE(VI)
BROWN, ID
[J]. JOURNAL OF SOLID STATE CHEMISTRY, 1974, 11 (03) : 214 - 233
[7] THE EFFECTS OF ANNEALING ON THE STRUCTURE AND COMPOSITION OF ELECTRON-BEAM-EVAPORATED TIN OXIDE-FILMS
CHOUDHURY, NS
GOEHNER, RP
LEWIS, N
GREEN, RW
[J]. THIN SOLID FILMS, 1984, 122 (03) : 231 - 241
[8] CHUAH DGS, 1986, MATER LETT, V4, P274, DOI 10.1016/0167-577X(86)90023-6
[9] APPLICATION OF THE MOSSBAUER-EFFECT TO THE CHARACTERIZATION OF AN AMORPHOUS TIN-OXIDE SYSTEM
COLLINS, GS
KACHNOWSKI, T
BENCZERKOLLER, N
PASTERNAK, M
[J]. PHYSICAL REVIEW B, 1979, 19 (03): : 1369 - 1373
[10] PROPERTIES OF ELECTRON-BEAM-EVAPORATED TIN OXIDE-FILMS
DAS, D
BANERJEE, R
[J]. THIN SOLID FILMS, 1987, 147 (03) : 321 - 331

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