MOBILITIES OF SINGLY AND DOUBLY CHARGED RARE-GAS IONS IN HELIUM AND IN NEON

被引:19
作者
JOHNSEN, R
BIONDI, MA
机构
[1] Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh
关键词
D O I
10.1103/PhysRevA.20.221
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Mobilities of singly and doubly charged ions of neon, argon, krypton, and xenon in helium and of xenon in neon have been determined in a drift-tube mass-spectrometer apparatus at temperatures near 300 K and for 10EN100 Td. The zero-field reduced mobility of a given doubly charged ion is found to be either equal to or slightly smaller than that of its singly charged counterpart. However, the dependences of the mobilities on EN are found to be strikingly different for the two cases. No difference in mobility is observed between doubly charged ions in the low-lying, metastable states and in their ground state, in contrast to the case of the ions drifting in their parent gases. © 1979 The American Physical Society.
引用
收藏
页码:221 / 223
页数:3
相关论文
共 7 条
[1]   THE MOBILITIES OF IONS IN UNLIKE GASES [J].
DALGARNO, A ;
MCDOWELL, MRC ;
WILLIAMS, A .
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1958, 250 (982) :411-425
[2]   MEASUREMENTS OF RADIATIVE CHARGE-TRANSFER REACTIONS OF DOUBLY AND SINGLY CHARGED RARE-GAS IONS WITH RARE-GAS ATOMS AT THERMAL ENERGIES [J].
JOHNSEN, R ;
BIONDI, MA .
PHYSICAL REVIEW A, 1978, 18 (03) :996-1003
[3]   MOBILITIES OF MASS-IDENTIFIED ATOMIC IONS IN NOBLE-GASES [J].
JOHNSEN, R ;
LEU, MT ;
BIONDI, MA .
PHYSICAL REVIEW A, 1973, 8 (05) :2557-2563
[4]   MOBILITIES OF DOUBLY CHARGED RARE-GAS IONS IN THEIR PARENT GASES [J].
JOHNSEN, R ;
BIONDI, MA .
PHYSICAL REVIEW A, 1978, 18 (03) :989-995
[5]  
Kaneko Y., 1978, Mass Spectroscopy, V26, P35
[6]   MOBILITIES OF VARIOUS MASS-IDENTIFIED POSITIVE-IONS IN HELIUM AND ARGON [J].
LINDINGER, W ;
ALBRITTON, DL .
JOURNAL OF CHEMICAL PHYSICS, 1975, 62 (09) :3517-3522
[7]   SYMMETRIC RESONANCE DOUBLE CHARGE-TRANSFER IN KR+++KR AND XE+++XE SYSTEMS [J].
OKUNO, K ;
KOIZUMI, T ;
KANEKO, Y .
PHYSICAL REVIEW LETTERS, 1978, 40 (26) :1708-1710